Contacts

Hans Kerkhoff

Position:Associate Professor
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Web:
 
Address:Zilverling 5078
P.O. Box 217
7500 AE Enschede
The Netherlands
Telephone:+31 53 489 2646
Fax:+31 53 489 4590
Secretary:+31 53 489 3770
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Publications:

2014

Kerkhoff, H.G. and Wan, Jinbo and Zhao, Yong (2014) Linking aging measurements of health-monitors and specifications for multi-processor SoCs. In: IEEE International Conference On Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 06-08 May 2014, Santorini, Greece. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-4972-4
Khan, M.A. and Kerkhoff, H.G. (2014) Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, 23-25 April 2014, Warsaw, Poland. pp. 15-20. IEEE . ISBN 978-1-4799-4558-0
Rohani, A. and Kerkhoff, H.G. (2014) Two soft-error mitigation techniques for functional units of DSP processors. In: 19th IEEE European Test Symposium, ETS 2014 , 28-30 May 2014, Paderborn, Germany. pp. 1-6. IEEE Computer Society. ISBN 978-1-4799-3415-7
Wan, Jinbo and Kerkhoff, H.G. (2014) The influence of no fault found in analogue CMOS circuits. In: 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), 17-19 Sep 2014, Porto Alegre, Brazil. pp. 1-6. IEEE Computer Society. ISBN 978-1-47996-540-3
Wan, Jinbo and Kerkhoff, H.G. (2014) An embedded offset and gain instrument for OpAmp IPs. In: Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 24-28 March 2014, Dresden, Germany. pp. 1-4. Electronic Design Automation Publishing Association. ISBN 978-3-9815370-2-4
Zhao, Yong and Kerkhoff, H.G. (2014) Design of an embedded health monitoring infrastructure for accessing multi-processor soc degradation. In: 17th Euromicro Conference on Digital System Design (DSD) , 27-29 Aug 2014, Verona, Italy. pp. 154-160. IEEE Computer Society. ISBN 978-1-4799-5793-4

2013

Khan, M.A. and Kerkhoff, H.G. (2013) Monitoring operating temperature and supply voltage in achieving high system dependability. In: 8th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 Mar 2013, Abu Dhabi, UAE. pp. 108-112. IEEE. ISBN 978-1-4673-6039-5
Khan, M.A. and Kerkhoff, H.G. (2013) An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. In: 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, 8-10 April 2013, Karlovy Vary, Czech Republic. pp. 159-164. IEEE . ISBN 978-1-4673-6135-4
Khan, M.A. and Kerkhoff, H.G. (2013) The essence of reliability estimation during operational life for achieving high system dependability. In: 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain. pp. 575-581. IEEE . ISBN 978-0-7695-5074-9
Khan, M.A. and Kerkhoff, H.G. (2013) Analysing degradation effects in charge-redistribution SAR ADCs. In: 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, 2-4 Oct 2013, New York, USA. pp. 65-70. IEEE . ISSN 1550-5774 ISBN 978-1-4799-1583-5
Krishnan, S. and Kerkhoff, H.G. (2013) Exploiting multiple mahalanobis distance metric to screen outliers from analogue product manufacturing test responses. IEEE design and test of computers, 30 (3). pp. 18-24. ISSN 0740-7475 ISBN 978-1-4577-0711-7 *** ISI Impact 1,62 ***
Rohani, A. and Kerkhoff, H.G. (2013) Rapid Transient Fault Insertion in Large Digital Systems. Microprocessors and microsystems, 37 (2). pp. 147-154. ISSN 0141-9331 *** ISI Impact 0,55 ***
Rohani, A. and Kerkhoff, H.G. (2013) Functional unit for a processor. Patent EP13191370.9 (Application).
Rohani, A. and Kerkhoff, H.G. and Costenaro, E. and Alexandrescu, D. (2013) Pulse-length determination techniques in the rectangular single event transient fault model. In: International Conference on Embedded Computer Systems: architectures, modeling, and simulation, SAMOS XIII, 15-18 Jul 2013, Samos, Greece. pp. 213-218. IEEE Computer Society. ISBN 978-1-4799-0103-6
Wan, Jinbo and Kerkhoff, H.G. (2013) An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. In: 14th International Symposium on Quality Electronic Design (ISQED 2013), 4-6 Mar 2013, Santa Clara, CA, USA. pp. 31-37. International Society for Quality Electronic Design. ISSN 1948-3295 ISBN 978-1-4673-4953-6
Zhao, Yong and Kerkhoff, H.G. (2013) An embedded health-monitoring infrastructure for a reliable multi-core processor. In: Proceedings of the Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, Median 2013, May 30-31, Avignone, France. pp. 31-34. COST . ISBN 978-2-11129175-1
Zhao, Yong and Zhang, Xiao and Kerkhoff, H.G. (2013) Power-dissipation comparison of two dependability approaches for multi-processor systems. In: 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) , 26-28 March 2013, Abu Dhabi. pp. 56-61. IEEE Circuits & Systems Society. ISBN 978-1-4673-6039-5

2012

Kerkhoff, H.G. and Wan, Jinbo and Zhao, Yong (2012) Hierarchical modeling of automotive sensor front-ends for structural diagnosis of aging faults. In: 18th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2012, 14-16 May 2012, Taipei, Taiwan, China. pp. 91-96. IEEE Computer Society. ISBN 978-1-4673-1925-6
Kerkhoff, H.G. and Zhao, Yong (2012) The design of dependable flexible multi-sensory System-on-Chips for security applications. In: 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2012, 18-20 April 2012, Tallinn, Estonia. pp. 133-138. IEEE Computer Society. ISBN 978-1-4673-1187-8
Rohani, A. and Kerkhoff, H.G. (2012) An online soft error mitigation technique for control logic of VLIW processors. In: Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2012, Austin, TX, USA. pp. 85-91. IEEE Computer Society. ISBN 978-1-4673-3042-8
Senouci, B. and Annema, A.-J. and Bentum, M.J. and Kerkhoff, H.G. (2012) Investigating dependability of short-range wireless embedded systems through hardware platform based design. In: 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN2012), 25-28 June 2012, Boston, Massachusetts, USA. pp. 1-7. IEEE Antennas & Propagation Society. ISBN 978-1-4673-1625-5
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2012) ADC multi-site test based on a pre-test with digital input stimulus. Journal of Electronic Testing: Theory and Applications, 28 (4). pp. 393-404. ISSN 0923-8174 ISBN 978-1-4577-0711-7 *** ISI Impact 0,45 ***
Wan, Jinbo and Kerkhoff, H.G. (2012) Monitoring active filters under automotive aging scenarios with embedded instrument. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, 12-16 Mar 2012, Dresden, Germany. pp. 1096-1101. Electronic Design Automation Publishing Association. ISSN 1530-1591 ISBN 978-1-4577-2145-8

2011

Ahonen, T. and ter Braak, T.D. and Burgess, S.T. and Geißler, R. and Heysters, P.M. and Hurskainen, H. and Kerkhoff, H.G. and Kokkeler, A.B.J. and Nurmi, J. and Rauwerda, G.K. and Smit, G.J.M. and Zhang, Xiao (2011) CRISP: Cutting Edge Reconfigurable ICs for Stream Processing. In: Reconfigurable Computing: From Fpgas to Hardware/Software Codesign. Springer Verlag, London, pp. 211-238. ISBN 978-1-46140-060-8
Kerkhoff, H.G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 5-11. IEEE Computer Society. ISBN 978-0-7695-4479-3
Kerzerho, V.A. and Kerkhoff, H.G. and Bollen, G-J and Xing, Y (2011) The Search for Resilience Weak Spots in Automotive Mixed-Signal Circuits. In: Proceedings 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 12-18. IEEE Computer Society. ISSN 0168-275X ISBN 978-0-7695-4479-3
Khan, M.A. and Kerkhoff, H.G. (2011) A System-Level Platform for Dependability Enhancement and its Analysis for Mixed-Signal SoCs. In: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2011, 13-15 April 2011, Cottbus, Germany. pp. 17-22. IEEE . ISBN 978-1-4244-9753-9
Khan, M.A. and Kerkhoff, H.G. (2011) SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 3-5 Oct 2011, Vancouver, B.C. Canada. pp. 374-381. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-4556-1
Krishnan, S. and Kerkhoff, H.G. (2011) A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway. pp. 159-164. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4577-0483-3
Rohani, A. and Kerkhoff, H.G. (2011) Study of the effects of SET induced faults on submicron technologies. In: 41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011, 27-30 June 2011, Hong Kong. pp. 41-46. IEEE Computer Society. ISBN 978-1-4577-0374-4
Rohani, A. and Kerkhoff, H.G. (2011) A Technique for Accelerating Injection of Transient Faults in Complex SoCs. In: 14th Euromicro Conference on Digital System Design, DSD 2011, 31 Aug-02 Dec 2011, Oulu, Finland. pp. 213-220. IEEE Computer Society. ISBN 978-1-4577-1048-3
Senouci, B. and Annema, A.-J. and Bentum, M.J. and Kerkhoff, H.G. (2011) Functional framework and hardware platform for dependability study in short range wireless embedded systems. (Invited) In: 17th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, 16-18 May 2011, Santa Barbara, California. pp. 127-132. IEEE Computer Society. ISBN 978-0-7695-4479-3
Wan, Jinbo and Kerkhoff, H.G. (2011) Boosted gain programmable OpAmp with embedded gain monitor for dependable SoCs. In: 2011 International SoC Design Conference, ISOCC 2011, 17-18 Nov 2011, Jeju, Korea. pp. 294-297. IEEE Circuits & Systems Society. ISBN 978-1-4577-0711-7
Zhang, Xiao and Kerkhoff, H.G. (2011) A Dependability Solution for Homogeneous MPSoCs. In: 17th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2011, 12-14 Dec 2011, Pasadena, CA, USA. pp. 53-62. IEEE Computer Society. ISSN 1082-3409 ISBN 978-0-7695-4590-5

2010

ter Braak, T.D. and Burgess, S.T. and Hurskainen, H. and Kerkhoff, H.G. and Vermeulen, B. and Zhang, Xiao (2010) On-Line Dependability Enhancement of Multiprocessor SoCs by Resource Management. In: Proceedings of the 2010 International Symposium on System-on-Chip, 29-30 Sep 2010, Tampere, Finland. pp. 103-110. IEEE Circuits and Systems Society. ISBN 978-1-4244-8276-4
Kerkhoff, H.G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010), 7-9 June 2010, La Grande Motte, France. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-7792-0
Kerkhoff, H.G. and Zhang, Xiao (2010) Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor. In: Fifth IEEE International Symposium on Electronic Design, Test & Applications, DELTA 2010, 13-15 Jan 2010, Ho Chi Minh City, Vietnam. pp. 270-275. IEEE Computer Society. ISBN 978-0-7695-3978-2
Krishnan, S. and Kerkhoff, H.G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010 , Praha, Czech republic. pp. 250-251. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9
Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand, R. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany. pp. 1767-1772. IEEE. ISSN 1530-1591 ISBN 978-1-4244-7054-9
Sheng, Xiaoqin and Kerkhoff, H.G. (2010) Improved method for SNR prediction in machine-learning-based test. In: 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 07-09 June 2010, La Grande Motte, France. pp. 1-4. IEEE Computer Society. ISBN 978-1-4244-7792-0
Sheng, Xiaoqin and Kerkhoff, H.G. (2010) The test ability of an adaptive pulse wave for ADC testing. In: Proceedings of the IEEE 19th Asian Test Symposium (ATS 2010), 1-4 December 2010, Shanghai, China. pp. 289-294. IEEE Computer Society. ISBN 978-0-7695-4248-5
Sheng, Xiaoqin and Kerzerho, V.A. and Kerkhoff, H.G. (2010) Predicting dynamic specifications of ADCs with a low-quality digital input signal. In: Proceedings of the 15th European Test Symposium, ETS 2010, 24-28 May 2010 , Prague, Czech Republic. pp. 158-163. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9
Zhang, Xiao and Kerkhoff, H.G. and Vermeulen, B. (2010) On-Chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. In: Proceedings of the 13th Euromicro Conference on Digital System Design, DSD 2010, 1-3 Sep 2010, Lille, France. pp. 531-537. IEEE Computer Society. ISBN 978-0-7695-4171-6
Zhang, Xiao and Kerkhoff, H.G. and Vermeulen, B. (2010) New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. In: 15th IEEE European Test Symposium (ETS 2010), 24-28 May 2010, Praha, Czech Republic. pp. 243-244. IEEE Computer Society. ISSN 1530-1877 ISBN 978-1-4244-5834-9

2009

Kerkhoff, H.G. (2009) Dependable reconfigurable multi-sensor poles for security. In: 15th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2009), 10-12 Jun 2009, Scottsdale, AZ, USA. pp. 1-6. IEEE Computer Society. ISBN 978-1-4244-4618-6
Kerkhoff, H.G. and Zhang, Xiao (2009) Fault co-simulation for test evaluation of heterogeneous integrated biological systems. Microelectronics journal, 40 (7). pp. 1048-1053. ISSN 0026-2692 *** ISI Impact 0,91 ***
Sheng, Xiaoqin and Kerkhoff, H.G. (2009) Two improved methods for testing ADC parametric faults by digital input signals. In: IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop, IMSTW 2009, 10-12 June 2009, Scottsdale, AZ. pp. 1-5. IEEE Computer Society. ISBN 978-1-4244-4618-6
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2009) Algorithms for ADC multi-site test with digital input stimulus. In: Proceedings of the 2009 14th European Test Symposium, 25-29 May 2009, Seville, Spain. pp. 45-50. IEEE Computer Society. ISBN 978-0-7695-3703-0
Zhang, Xiao and Kerkhoff, H.G. (2009) Design of a Highly Dependable Beamforming Chip. In: Proceedings of Euromicro on Digital System Design (DSD09), 27-29 Aug 2009, Patras, Greece. pp. 729-735. IEEE Computer Society. ISBN 978-0-7695-3782-5

2008

Kerkhoff, H.G. and Huijts, J.J.M. (2008) Testing of a highly reconfigurable processor core for dependable data streaming applications. In: Proceedings Fouth IEEE International Symposium on Electronic Design, Test and Applications DELTA 2008, 23-25 January 2008, Hong Kong, SAR, China. pp. 38-44. IEEE Computer Society. ISBN 978-0-7695-3110-6
Kerkhoff, H.G. and Kuiken, O.J. and Zhang, Xiao (2008) Increasing SoC Dependability via Known Good Tile NoC Testing. In: FastAbs Track of The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN2008), 24-27 June 2009, Anchorage, Alaska. Paper 14. Unpublished. ISBN not assigned
Kerkhoff, H.G. and Zhang, Xiao and Mailly, F. and Nouet, P. and Liu, H. and Richardson, A. (2008) A dependable microelectronic peptide synthesizer using electrode data. VLSI Design, 2008. pp. 1-9. ISSN 1065-514X
Kuiken, O.J. and Zhang, Xiao and Kerkhoff, H.G. (2008) Built-in self-diagnostics for a NoC-based reconfigurable IC for dependable beamforming applications. In: The 23rd IEEE International symposium on defect and fault-tolerance in VLSI systems DFT 2008, 1-3 Oct 2008, Cambridge, MA, USA. pp. 45-53. IEEE Computer Society. ISSN 1550-5774 ISBN 978-0-7695-3365-0
Sheng, Xiaoqin and Kerkhoff, H.G. and Zjajo, A. and Gronthoud, G. (2008) Exploring dynamics of embedded ADC through adapted digital input stimuli. In: 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE, 18-20 Jun 2008, Vancouver, BC. pp. 1-7. IEEE Computer Society. ISBN 978-1-4244-2395-8
Zhang, Xiao and van Proosdij, F. and Kerkhoff, H.G. (2008) A droplet routing technique for fault-tolerant digital microfluidic devices. In: IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008, 18-20 Jun 2007, Vancouver, BC. pp. 1-7. IEEE Computer Society. ISBN 978-1-4244-2395-8

2007

Kerkhoff, H.G. (2007) Testing microelectronic biofluidic systems. IEEE Design and Test of Computers, 24 (1). pp. 72-82. ISSN 0740-7475 *** ISI Impact 1,62 ***
Zhang, Xiao and Kerkhoff, H.G. and Mailly, F. and Nouet, P. (2007) Dependable MEF Systems based on Control and Direct Sensing Electrodes via Current and Impedance Self-Tests. In: Proceedings of the 18th annual workshop on Circuits, Systems and Signal Processing, 29-30 Nov 2007, Veldhoven, The Netherlands. pp. 1-3. Technology Foundation STW. ISBN 978-90-73461-49-9
Zhang, Xiao and Kerkhoff, H.G. and Mailly, F. and Nouet, P. and Liu, H. and Richardson, A. (2007) A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests. In: 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop, 18-20 Jun 2007, Póvoa de Varzim, Portugal. pp. 176-181. University of Porto. ISBN 978-972-99181-2-4

2006

Kerkhoff, H.G. (2006) Testable Design and Testing of Microsystems. In: Design of Systems on a Chip. Springer, Berlin - Heidelberg - New York, pp. 203-219. ISBN 978-0-387-32499-9
Kerkhoff, H.G. and Barber, R.W. and Zhang, Xiao and Emerson, D.R. (2006) Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. In: Proceedings of third IEEE International Workshop on Electronic Design, Test & Applications DELTA 2006, 17 - 19 jan 2006, Kuala Lumpur, Malaysia. pp. 177-182. Conference Publishing Services. IEEE Computer Society. ISBN 0-7695-2500-8
Kerkhoff, H.G. and Zhang, Xiao (2006) Fault simulation of heterogeneous integrated biological systems. In: Proceedings of the 12th IEEE International mixed signal testing workshop, 21-23 jun 2006, Edinburgh, United Kingdom. pp. 129-134. ISBN not assigned
Liu, Hongyuan and Dumas, N. and Richardson, A. and Heal, R. and Kerkhoff, H.G. (2006) Built-in test of electrode degradation of multi-electrode array biosensors. In: Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), 21-23 jun 2006, Edinburgh, United Kingdom. pp. 136-141. ISLI en Lancaster University. ISBN not assigned

2005

Joseph, A.A. and Flokstra, Jaap and Kerkhoff, H.G. (2005) Structural Testing of RSFQ Circuits. In: The 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005), 5-9 September 2005, Noordwijkerhout, The Netherlands. PB.13. University of Twente. ISBN not assigned
Joseph, A.A. and Kerkhoff, H.G. (2005) Testing Superconductor Logic Integrated Circuits. In: 10th IEEE European Test Symposium (ETS'05), 22-25 May 2005, Talinn, Estonia. pp. 239-244. informal digest of papers van IEEE European Test Symposium IEEE Computer Society en TTTC. IEEE. ISBN 0-7695-2341-2
Joseph, A.A. and Sesé, J. and Flokstra, Jaap and Kerkhoff, H.G. (2005) Structural testing of the HYPRES Niobium process. IEEE transactions on applied superconductivity, 15 (2). pp. 106-109. ISSN 1051-8223 *** ISI Impact 1,20 ***
Kerkhoff, H.G. (2005) The test search for true mixed-signal cores. Microelectronics journal, 36 (12). pp. 1103-1111. ISSN 0026-2692 *** ISI Impact 0,91 ***
Kerkhoff, H.G. (2005) Testing of MEMS-based microsystems. In: Proceedings of the 10th IEEE European Test Symposium, ETS 2005, 22-25 May 2005, Talinn, Estonia. pp. 223-228. IEEE. ISBN 0-7695-2341-2
Kerkhoff, H.G. (2005) Testable Design and testing of Microsystems. (Invited) In: The 4th IEEE Conference on Sensors - Abstracts and Biographies for Tutorials at IEEE Sensors, 31. Oct 2005, 31 Oct- 3 Nov 2005, Irvine, California, USA. IEEE. ISBN not assigned
Kerkhoff, H.G. and Barber, R.W. and Emerson, D.R. and van der Wouden, E.J. (2005) Design and Test of Micro-Electronic Fluidic Systems. (Invited) In: Proceedings Workshop on MEMS, DATE05 Workshops, 1 March 2005, Munich, Germany. pp. 47-52. W1: MEMS/MST and Their Perspective in Electronic System. IEEE. ISBN not assigned
Kerkhoff, H.G. and van de Kraats, A. (2005) Mixed-Signal Testability Analysis for Data-Converter IPs. In: Proceedings ProRISC 2005, 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands. pp. 1-6. Technology Foundation STW. ISBN 90-73461-50-2
Kerkhoff, H.G. and Zhang, Xiao and Liu, H. and Nouet, P. and Azais, F. (2005) Determining DfT Hardware by VHDL-AMS Fault Simulation for Biological Micro-Electronic Fluidic Arrays. In: Proc. ProRISC 2005 Proceedings of 16th Workshop on Circuits, Systems and Signal Processing, 17-18 November 2005, Veldhoven, The Netherlands. pp. 1-5. Technology Foundation STW. ISBN 90-73461-50-2
Kerkhoff, H.G. and Zhang, Xiao and Liu, Hongyuan and Richardson, A. and Nouet, P. and Azais, F. (2005) VHDL-AMS fault simulation for testing DNA bio-sensing arrays. In: IEEE Proceedings of Sensors, 30 Oct - 03 Nov 2005, Irvine, CA, USA. pp. 1030-1033. Piscataway. ISBN 0-7803-9056-3
van de Kraats, A. and Kerkhoff, H.G. (2005) Testability Analysis for true Mixed-Signal Integrated Circuits. In: Proceedings of IEEE 11th International Mixed Signal Test Workshop, 27-29 June 2005, Cannes, France. pp. 1-6. TIMA Laboratory. ISBN not assigned
Liu, H. and Kerkhoff, H.G. and Richardson, A. and Zhang, Xiao and Nouet, P. and Azais, F. (2005) Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays. In: Proceedings of 11th International Mixed Signal Test Workshop, 27-29 June 2005, Cannes, France. pp. 1-6. TIMA Laboratory. ISBN not assigned
Nedelcu, O. and Barber, R.W. and Kerkhoff, H.G. and Emerson, D.R. and Muller, R. and van der Wouden, E.J. (2005) Simulation of Micro-Electronic FlowFET Systems. In: Euromech Colloquium 472, Microfluidics and Transfer, Abstracts of Euromech, 6-8 Septeber 2005, Grenoble, France. pp. 1-4. Euromech - European Mechanics Society. ISBN not assigned
Nedelcu, O. and Barber, R.W. and Kerkhoff, H.G. and Emerson, D.R. and Muller, R. and van der Wouden, E.J. (2005) Modeling of Micro-Electronic Fluidic Systems. Romanian Journal of Information Science and Technology (ROMJIST) , 8 (4). pp. 363-369. ISSN 1453-8245 *** ISI Impact 0,28 ***

2001

San Segundo Bello, D. and Tangelder, R. and Kerkhoff, H.G. (2001) Modeling a verification test system for mixed-signal circuits. IEEE design and test of computers, 18 (1). pp. 63-71. ISSN 0740-7475 *** ISI Impact 1,62 ***